"Power mit Nano" elektronik report juli/august 2008 p 6 (pdf)
Events
Awards
EV Group wins Frost & Sullivan?s European Nanoimprint Technology Product Innovation Award - link
NNT 2010, Copenhagen: 1st Prize, Best Poster Award: Ursula Palfinger: nanoimprinted Compelmentary Organic Inverters and Ring Oscillators picture
Informationstagung Mikroelektronik ME 2010: Best Paper Award Nanoelectronics: Elisabeth Lausecker: UV nanoimprint lithography for advanced micro- and nanostructuringpicture
BACUS 2009: Third Best Presentation: Elmar Platzgummer, Stefan Cernusca, Christof klein, Samuel Kvasnica, Bernd Sonalkar, Hans Loeschner: eMET: Development of a 50kEV electron projection muli-beam Mask Exposure Tool for the 16nm hp Technolgy Node and below
PECS 2009: Second Best Oral Presentation: Iris Bergmair: Fabrication of Large Area Negative Index Materials by Nanoimprint Lithography
BACUS 2008: Second Best Oral Presentation Award: E. Platzgummer, H. Loeschner, G. Gross: Results obtained with the CHARPAN Engineering Tool and prospect of the Ion Mask Exposure Tool (iMET)
BACUS 2008: Best Poster Award: Florian Letzkus, Joerg Butschke, Mathias Irmscher, Michael Jurisch, and Wolfram Klingler (IMS Chips (Germany)), Elmar Platzgummer, Christof Klein, Hans Loeschner, and Reinhard Springer (IMS Nanofabrication AG (Austria)): Deflecton unit for multi-beam mask making
BACUS 2008: Second Best Poster Award: Joerg Butschke, Mathias Irmscher, Holger Sailer, Lorenz Nedelmann, and Marcus Pritschow IMS Chips (Germany), Hans Loeschner and Elmar Platzgummer (IMS Nanofabrication AG (Austria)): Mask patterning for the 22nm node using a proton multi-beam projection pattern generator
Press Releases
CEA-Leti to Implement Multiple EV Group Systems on its New 300-mm Fab Line Dedicated to 3D Integration - link
EV Group wins Frost & Sullivan?s European Nanoimprint Technology Product Innovation Award - link
EV Group Breaks through Resolution Barrier with Introduction of Soft UV Nanoimprint Lithography Technology - link - EVG-Pressrelease October 2010